Title :
Optical reflectometry for in-situ monitoring of carbon nanotubes deposition by optical tweezers
Author :
Kashiwagi, Ken ; Yamashita, Shinji ; Set, Sze Yun
Author_Institution :
Department of Electronic Engineering, Graduate School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-Ku, 113-8656, JAPAN
Abstract :
Reflectometry is adopted for in-situ monitoring of carbon nanotubes deposition to fiber end by optical tweezers. Reflectivity increases drastically once CNTs are deposited, and enhancement of layer uniformity is observed through damping of reflectivity flucutuation.
Keywords :
Carbon nanotubes; Erbium-doped fiber amplifier; Monitoring; Optical attenuators; Optical refraction; Optical sensors; Optical variables control; Reflectivity; Reflectometry; Ultrafast optics;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/QELS.2007.4431161
