• DocumentCode
    2788971
  • Title

    Process variation tolerant all-digital multiphase DLL for DDR3 interface

  • Author

    Kang, H.C. ; Ryu, K.H. ; Lee, D.H. ; Lee, W. ; Kim, S.H. ; Choi, J.R. ; Jung, S.O.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
  • fYear
    2010
  • fDate
    19-22 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An all-digital multiphase DLL is presented that is robust to delay mismatch due to process variation. Each of four 90° phase shift blocks accurately align each phase to 90° delay using its own ring oscillator and locking delay code. Harmonic locking is protected by a ring oscillator and a counter. An area efficient binary to thermometer converter is proposed to diminish the area overhead due to four delay line controllers. An edge combiner is used for duty cycle correction and clock 2x multiplications. The measured large locking delay code difference between four 90° phase shift delay lines in the proposed DLL implemented in 45nm CMOS process, which corresponds to ±31ps at 800MHz, proves that the DLL corrects significant phase error caused by delay mismatch. Phase shift accuracy errors at 90° and 270° phases are 0.43° and 1.01°, respectively, and output frequency is 1.6GHz with 50% duty cycle at 800MHz. Power consumption is 3.3mW at 800MHz.
  • Keywords
    CMOS integrated circuits; delay lock loops; oscillators; CMOS process; DDR3 interface; all-digital multiphase DLL; clock 2x multiplication; double data rate memory; duty cycle correction; edge combiner; frequency 1.6 GHz; frequency 800 MHz; harmonic locking; locking delay code; phase shift accuracy error; power 3.3 mW; ring oscillator; size 45 nm; thermometer converter; Accuracy; Calibration; Clocks; Delay; Delay lines; Image edge detection; Ring oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2010 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4244-5758-8
  • Type

    conf

  • DOI
    10.1109/CICC.2010.5617474
  • Filename
    5617474