• DocumentCode
    2789366
  • Title

    GUI Software Fault Localization Using N-gram Analysis

  • Author

    Yu, Zhongxing ; Hu, Hai ; Bai, Chenggang ; Cai, Kai-Yuan ; Wong, W. Eric

  • Author_Institution
    Dept. of Autom. Control, Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
  • fYear
    2011
  • fDate
    10-12 Nov. 2011
  • Firstpage
    325
  • Lastpage
    332
  • Abstract
    Graphical User Interfaces (GUIs) have become an important and accepted way of interacting with today´s software. Fault localization is considered to be one of the most expensive program debugging activities. This paper presents a fault localization technique designed for GUI software. Unlike traditional software, GUI test cases usually are event sequences and each individual event has a unique corresponding event handler. We apply data mining techniques to the event sequences and their output data in terms of failure detections collected in the testing phase to rank the fault proneness of the event handlers for fault localization. Our method applies N-gram analysis to rank the event handlers of GUI programs and data collected from case studies on four real life GUI programs demonstrate the effectiveness of the proposed technique.
  • Keywords
    data mining; graphical user interfaces; software fault tolerance; GUI software fault localization; N-gram analysis; data mining technique; event handler; event sequence; graphical user interface; Association rules; Graphical user interfaces; Itemsets; Software; Software algorithms; Testing; GUIs; N-gram analysis; event handler; event sequences; fault localization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Assurance Systems Engineering (HASE), 2011 IEEE 13th International Symposium on
  • Conference_Location
    Boca Raton, FL
  • ISSN
    1530-2059
  • Print_ISBN
    978-1-4673-0107-7
  • Type

    conf

  • DOI
    10.1109/HASE.2011.29
  • Filename
    6113915