DocumentCode
2789366
Title
GUI Software Fault Localization Using N-gram Analysis
Author
Yu, Zhongxing ; Hu, Hai ; Bai, Chenggang ; Cai, Kai-Yuan ; Wong, W. Eric
Author_Institution
Dept. of Autom. Control, Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
fYear
2011
fDate
10-12 Nov. 2011
Firstpage
325
Lastpage
332
Abstract
Graphical User Interfaces (GUIs) have become an important and accepted way of interacting with today´s software. Fault localization is considered to be one of the most expensive program debugging activities. This paper presents a fault localization technique designed for GUI software. Unlike traditional software, GUI test cases usually are event sequences and each individual event has a unique corresponding event handler. We apply data mining techniques to the event sequences and their output data in terms of failure detections collected in the testing phase to rank the fault proneness of the event handlers for fault localization. Our method applies N-gram analysis to rank the event handlers of GUI programs and data collected from case studies on four real life GUI programs demonstrate the effectiveness of the proposed technique.
Keywords
data mining; graphical user interfaces; software fault tolerance; GUI software fault localization; N-gram analysis; data mining technique; event handler; event sequence; graphical user interface; Association rules; Graphical user interfaces; Itemsets; Software; Software algorithms; Testing; GUIs; N-gram analysis; event handler; event sequences; fault localization;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Assurance Systems Engineering (HASE), 2011 IEEE 13th International Symposium on
Conference_Location
Boca Raton, FL
ISSN
1530-2059
Print_ISBN
978-1-4673-0107-7
Type
conf
DOI
10.1109/HASE.2011.29
Filename
6113915
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