DocumentCode :
2789771
Title :
Resistance measurements on point-contact diodes
Author :
Riccius, H.D. ; Jones, L.H.
Author_Institution :
National Research Council of Canada
fYear :
1989
fDate :
0-0 1989
Firstpage :
252
Lastpage :
253
Abstract :
Experiments have shown that the conductance of any point-contact diode consisting of a metal whisker in mechanical contact with either a metal, semi-metal or semiconductor is an integral multiple of 4.3 x 10/sup -6/ /spl Omega//sup -1/.
Keywords :
Chemicals; Contact resistance; Councils; Electrical resistance measurement; Electrons; Force measurement; Frequency measurement; Infrared spectra; Physics; Semiconductor diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-87942-717-5
Type :
conf
DOI :
10.1109/ICMWFT.1989.763817
Filename :
763817
Link To Document :
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