Title :
Far-infrared magneto-optical resonance as a fundamental method of semiconductor characterization - state of the art
Author_Institution :
Osaka University
Abstract :
Time-resolved cyclotron resonance, intensity and linewidth measurement, as well as impurity Zeeman transition observa tion, with and without photoexcitation, may determine the quality of a semiconductor, leading to possible recommendation of crystal growth method.
Keywords :
Cyclotrons; Electrons; Magnetic field measurement; Magnetic resonance; Magnetooptic effects; Neodymium; Photonic band gap; Semiconductor impurities; Semiconductor materials; Temperature;
Conference_Titel :
Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-87942-717-5
DOI :
10.1109/ICMWFT.1989.763833
