• DocumentCode
    27917
  • Title

    Thru-reflect-line calibration for substrate integrated waveguide devices with tapered microstrip transitions

  • Author

    Diaz Caballero, Elena ; Belenguer, Angel ; Esteban, Hector ; Boria, Vicente E.

  • Author_Institution
    Inst. de Telecomun. y Aplic. Multimedia, Univ. Politec. de Valencia, Valencia, Spain
  • Volume
    49
  • Issue
    2
  • fYear
    2013
  • fDate
    January 17 2013
  • Firstpage
    132
  • Lastpage
    133
  • Abstract
    One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by the connectors and the tapered microstrip-to-SIW transitions are de-embedded from the measurements of the SIW structure by a thru-reflect-line calibration with an adequate and cheap SIW calibration kit.
  • Keywords
    calibration; planar waveguides; substrate integrated waveguides; waveguide transitions; SIW devices; planar structures; substrate integrated waveguide devices; tapered microstrip transitions; thru-reflect-line calibration;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2012.3027
  • Filename
    6420095
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=27917