Title :
A parametric test method for analog components in integrated mixed-signal circuits
Author :
Pronath, M. ; Gloeckel, V. ; Graeb, H.
Author_Institution :
Inst. of Electron. Design Autom., Tech. Univ. of Munich, Germany
Abstract :
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is applied to the response signal of the device under test (DUT). We show, that in comparison to Fourier transform or no transform at all, particular properties of this transformation are advantageous for mixed-signal test and especially built-in self test. We introduce a new method for test measurement selection based on a non-deterministic parametric fault model for analog circuits. This approach allows for noise and measurement error in testing. We show, how test quality can be optimized in the presented fault model. Our test methodology is demonstrated on an analog CMOS bandpass filter.
Keywords :
CMOS integrated circuits; Fourier transforms; band-pass filters; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; wavelet transforms; CMOS bandpass filter; Fourier transform; analog components; built-in self test; device under test; integrated mixed-signal circuits; measurement error; parametric fault model; parametric test method; test measurement selection; test stimuli; wavelet transform; Analog circuits; Automatic testing; Band pass filters; Circuit faults; Circuit noise; Circuit testing; Fourier transforms; Measurement errors; Semiconductor device modeling; Wavelet transforms;
Conference_Titel :
Computer Aided Design, 2000. ICCAD-2000. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-6445-7
DOI :
10.1109/ICCAD.2000.896531