• DocumentCode
    2794835
  • Title

    Nonintrusive Black- and White-Box Testing of Embedded Systems Software against UML Models

  • Author

    Graf, Philipp ; Müller, Klaus D. ; Reichmann, Clemens

  • Author_Institution
    Univ. of Karlsruhe, Karlsruhe
  • fYear
    2007
  • fDate
    28-30 May 2007
  • Firstpage
    130
  • Lastpage
    138
  • Abstract
    We extend a model based development approach for software components of embedded systems by a model based testing framework. We motivate by describing challenges a developer has to face when developing embedded software and present as a solution an UML-centric development approach. We introduce a testing framework that allows specification of test cases for UML class models using UML sequence- and use-case-diagrams. These test cases define participating objects and their messages including parameters, loops, control structures, inclusion of other collaborations and time constraints. These diagrams are verified against the real system-response of the software under test. We employ a commercial in-circuit emulator to record method calls, object identities and their parameters on C source-code level as messages with minimal impact on system performance and map these back to model level to verify them against the specified model.
  • Keywords
    Unified Modeling Language; embedded systems; formal specification; object-oriented programming; program control structures; program testing; program verification; C source-code level; UML class models; UML sequence; black-box testing; embedded systems software; method calls; model based development; model based testing; object identities; program control structures; program loops; program parameters; program verification; software components; software testing; use-case-diagrams; white-box testing; Actuators; Control systems; Embedded software; Embedded system; Hardware; Object oriented modeling; Software systems; Software testing; System testing; Unified modeling language;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Rapid System Prototyping, 2007. RSP 2007. 18th IEEE/IFIP International Workshop on
  • Conference_Location
    Porto Alegre
  • ISSN
    1074-6005
  • Print_ISBN
    0-7695-2834-1
  • Type

    conf

  • DOI
    10.1109/RSP.2007.30
  • Filename
    4228496