DocumentCode :
2795202
Title :
Study on dielectric properties of PMN-PZN-PT ferroelectric relaxor ceramics
Author :
Gui, Zhilun ; Li, Longtu ; Zhang, Xiaowen
Author_Institution :
Dept. of Mater. Sci. & Eng., Tsinghua Univ., Beijing, China
fYear :
1991
fDate :
8-12 Jul 1991
Firstpage :
816
Abstract :
The influence of additions and processing on the microstructure and properties of PMN-PZN-PT ceramics was studied. Experimental results showed that the DC bias character of PMN-based ceramics doped with PZN could be improved; proper excess MgO is advantageous to inhibiting the pyrochlore phase and increasing the dielectric constant. Dielectric loss could be decreased by adding MnO2. It was also found that air quenching and annealing under proper temperature can improve the microstructure and dielectric properties, particularly in increasing the voltage breakdown strength. The reasons for this are that uniform distributions of composition in grains and in grain boundaries and a lower order degree of Mg/Nb=1:1 in micro regions could be obtained by air quenching and annealing. The results indicated that the pyrochlore phase could be eliminated and perovskite structure could be stabilized effectively. The microstructure and breakdown mechanism were analyzed by means of XRD (X-ray diffraction), SEM (scanning electron microscopy), and STEM. Ferroelectric relaxor ceramics with high performance at low sintering temperature (900°C) were fabricated
Keywords :
X-ray diffraction examination of materials; annealing; ceramics; dielectric losses; dielectric properties of solids; electric strength; ferroelectric materials; lead compounds; permittivity; quenching (thermal); scanning electron microscope examination of materials; scanning-transmission electron microscope examination of materials; 900 degC; DC bias character; PMN-PZN-PT; PMN-PbZnO3NbO3-PbTiO3; PbMgO3NbO3-PbZnO3NbO3-PbTiO3; SEM; STEM; X-ray diffraction; air quenching; annealing; dielectric constant; dielectric loss; dielectric properties; ferroelectric relaxor ceramics; grain boundaries; microstructure; perovskite structure; pyrochlore phase; sintering temperature; voltage breakdown strength; Annealing; Ceramics; Dielectric breakdown; Dielectric constant; Dielectric losses; Ferroelectric materials; Grain boundaries; Microstructure; Scanning electron microscopy; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-87942-568-7
Type :
conf
DOI :
10.1109/ICPADM.1991.172192
Filename :
172192
Link To Document :
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