Title :
Functional vectors generation for RT-level Verilog descriptions based on path enumeration and constraint logic programming
Author :
Li, Tun ; Guo, Yang ; Liu, GongJie ; Li, Sikun
Author_Institution :
Nat. Univ. of Defense Technol., Changsha, China
fDate :
30 Aug.-3 Sept. 2005
Abstract :
This paper presents a novel method for automatic functional vectors generation from RT-level HDL descriptions based on path coverage and constraint solving. Compared with existing method, the advantage of this method includes: 1) it avoids generating redundant constraints, which will accelerate the test generation process, 2) it solves the problem of how to propagate the internal values to the primary inputs with decision models, 3) it can handle various HDL description styles, and various styles of designs. Experimental results conduct on several practical designs show that our method can efficiently improve the functional vectors generation process. The prototype system has been applied to verify RTL description of a real 32-bits microprocessor core and complex bugs remained hidden in the RTL descriptions are detected.
Keywords :
automatic test pattern generation; constraint handling; formal verification; hardware description languages; logic testing; RT-level HDL descriptions; RT-level Verilog descriptions; automatic functional vectors generation; constraint logic programming; constraint solving; decision models; path coverage; path enumeration; redundant constraints; test generation process; Automatic testing; Computer bugs; Explosions; Formal specifications; Hardware design languages; Life estimation; Logic programming; Microprocessors; Prototypes; Software testing;
Conference_Titel :
Digital System Design, 2005. Proceedings. 8th Euromicro Conference on
Print_ISBN :
0-7695-2433-8
DOI :
10.1109/DSD.2005.43