DocumentCode :
2797914
Title :
Soft NMR: Analysis & application to DSP systems
Author :
Kim, Eric P. ; Shanbhag, Naresh R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2010
fDate :
14-19 March 2010
Firstpage :
1494
Lastpage :
1497
Abstract :
We have recently proposed the concept of soft N-modular redundancy (soft NMR) in order to design robust and energy-efficient computing systems in nanoscale processes, where soft NMR was shown to achieve orders-of-magnitude improvement in robustness with significant power savings over NMR. In this paper, we analyze the performance of soft NMR and compare it with that of NMR and algorithmic noise-tolerance (ANT). An 8-b multiplier and a DCT-based still image compression system in a commercial 45nm CMOS process is considered. Two metrics of system performance: system reliability Pe,sys, and signal-to-noise ratio (SN R) are analyzed. We show that soft NMR always outperforms NMR and that our analysis predicts Pe,sys and SNR to within 4.2% and 2.7dB on average, respectively, of the results of Monte Carlo simulations.
Keywords :
CMOS digital integrated circuits; Monte Carlo methods; data compression; digital signal processing chips; image coding; integrated circuit reliability; DSP system; Monte Carlo simulation; algorithmic noise-tolerance; energy-efficient computing system; robust computing system; signal-to-noise ratio; soft N-modular redundancy; soft NMR; still image compression system; Algorithm design and analysis; CMOS process; Digital signal processing; Energy efficiency; Image coding; Noise robustness; Nuclear magnetic resonance; Performance analysis; Redundancy; System performance; CMOS digital integrated circuits; MAP estimation; image processing; nanotechnology; robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics Speech and Signal Processing (ICASSP), 2010 IEEE International Conference on
Conference_Location :
Dallas, TX
ISSN :
1520-6149
Print_ISBN :
978-1-4244-4295-9
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2010.5495498
Filename :
5495498
Link To Document :
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