• DocumentCode
    2799622
  • Title

    Synthesis methodology for built-in at-speed testing

  • Author

    Li, Yinghua ; Kondratyev, Alex ; Brayton, Robert

  • Author_Institution
    California Univ., Berkeley, CA, USA
  • fYear
    2005
  • fDate
    6-10 Nov. 2005
  • Firstpage
    183
  • Lastpage
    188
  • Abstract
    We discuss a new synthesis flow, which offers the ability to do easy delay testing almost free in terms of its impact on speed and area compared to corresponding implementations with standard cells. The methodology uses matched delays in pre-charged PLAs and bundled routing to produce a completion signal, which is guaranteed to lie on all critical paths. We give a nondelay testing method for ensuring matched delays are correct, i.e. that all completion signals arrive after their corresponding data signals. The design margins of the matched delays can be small since they are internal to the PLAs, which are regular structures and therefore more predictable.
  • Keywords
    built-in self test; integrated circuit testing; logic testing; programmable logic arrays; built-in at-speed testing; data signals; delay testing; matched delays; nondelay testing method; pre-charged PLA; synthesis flow; Circuit testing; Clocks; Delay estimation; Encoding; Latches; Microprocessors; Programmable logic arrays; Rails; Signal synthesis; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
  • Print_ISBN
    0-7803-9254-X
  • Type

    conf

  • DOI
    10.1109/ICCAD.2005.1560061
  • Filename
    1560061