DocumentCode
2799622
Title
Synthesis methodology for built-in at-speed testing
Author
Li, Yinghua ; Kondratyev, Alex ; Brayton, Robert
Author_Institution
California Univ., Berkeley, CA, USA
fYear
2005
fDate
6-10 Nov. 2005
Firstpage
183
Lastpage
188
Abstract
We discuss a new synthesis flow, which offers the ability to do easy delay testing almost free in terms of its impact on speed and area compared to corresponding implementations with standard cells. The methodology uses matched delays in pre-charged PLAs and bundled routing to produce a completion signal, which is guaranteed to lie on all critical paths. We give a nondelay testing method for ensuring matched delays are correct, i.e. that all completion signals arrive after their corresponding data signals. The design margins of the matched delays can be small since they are internal to the PLAs, which are regular structures and therefore more predictable.
Keywords
built-in self test; integrated circuit testing; logic testing; programmable logic arrays; built-in at-speed testing; data signals; delay testing; matched delays; nondelay testing method; pre-charged PLA; synthesis flow; Circuit testing; Clocks; Delay estimation; Encoding; Latches; Microprocessors; Programmable logic arrays; Rails; Signal synthesis; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
Print_ISBN
0-7803-9254-X
Type
conf
DOI
10.1109/ICCAD.2005.1560061
Filename
1560061
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