Can digital GaAs be used in a space environment? A look at single event upset in GaAs

The vulnerability to SEU (single event upset) of devices produced by standard GaAs processes is too great to allow their use in space applications without some type of mitigation technique. GaAs foundries can provide solutions for the short term by providing SEU hardened designs incorporating redundancy for latches in standard cell families and gate arrays. As research progresses, techniques are expected to be found to reduce charge enhancement effects in GaAs FETs. Industry-developed solutions for sidegating and backgating effects may also improve SEU sensitivity. Designs intended for SEU environments can incorporate several mitigation techniques to provide satisfactory operation. However, hardening at the device may provide the best performance option.<>