Title :
Reliability of high-power AlGaAs SQW grinsch lasers
Author :
Latta, E. ; Moser, A. ; Oosenbrug, A. ; Gasser, M. ; Forster, Th.
Author_Institution :
IBM Research Laboratory Zurich
Abstract :
Summary form only given. Detailed analysis of the change of the electro-optical performance of AIGaAs SQW GRINSCH lasers during life test enables a careful assessment of the reliability limits of these devices with respect to their applicability in optical data communication and optical data storage systems.
Keywords :
Gas lasers; Laser transitions; Lasers and electrooptics; Optical devices; Optical saturation; Power generation; Temperature; Thermal degradation; Ultraviolet sources;
Conference_Titel :
Semiconductor Laser Conference, 1990. Conference Digest. 12th IEEE International
Conference_Location :
Davos, Switzerland
DOI :
10.1109/ISLC.1990.764524
