DocumentCode

2800987

Title

Session 7C - Power noise and thermal issues

fYear

2005

fDate

6-10 Nov. 2005

Firstpage

625

Lastpage

626

Keywords

Semiconductor device noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on

Print_ISBN

0-7803-9254-X

Type

conf

DOI

10.1109/ICCAD.2005.1560142

Filename

1560142