• DocumentCode
    2802376
  • Title

    Using a thermal simulation model to interpret test data [air cooling of circuit boards]

  • Author

    Azar, Kaveh ; Manno, Vincent P.

  • Author_Institution
    AT&T Bell Lab., North Andover, MA, USA
  • fYear
    1992
  • fDate
    3-5 Feb 1992
  • Firstpage
    4
  • Lastpage
    10
  • Abstract
    The concurrent utilization of testing and simulation models is advocated as a means of improving the thermal characterization process. One such model based upon a combination of integral energy and momentum balances and local thermal networks is described. The general process of data interpretation using a simulation model is outlined as a series of guidelines. The process is illustrated through a series of tests involving air-cooling of boards with regular and irregular component layouts. Specific sensitivities tested included component powering, component height, and arrangement heterogeneity. The treatments of the convective heat transfer coefficient and the flow split among component flow channels were found to be the most important sensitivities in these tests. Using simulation models is considered to reduce uncertainties in estimating adiabatic heat transfer correlations. Recommendations and guidance are provided for an innovative approach to thermal characterization using existing technology
  • Keywords
    convection; cooling; packaging; printed circuit design; printed circuit testing; thermal analysis; adiabatic heat transfer correlations; air-cooling; arrangement heterogeneity; component flow channels; component height; component powering; convective heat transfer coefficient; energy balance; local thermal networks; momentum balances; parallel mounted circuit boards; test data interpretation; thermal characterization; thermal simulation model; Circuit simulation; Circuit testing; Cooling; Heat transfer; Pressure control; Printed circuits; Temperature control; Thickness control; Velocity control; Weight control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0500-0
  • Type

    conf

  • DOI
    10.1109/STHERM.1992.172845
  • Filename
    172845