• DocumentCode
    2803953
  • Title

    Integration of Statistical Techniques in the Design Curriculum

  • Author

    Koushanfar, Farinaz ; Potkonjak, Miodrag

  • Author_Institution
    Rice Univ., Houston
  • fYear
    2007
  • fDate
    3-4 June 2007
  • Firstpage
    153
  • Lastpage
    154
  • Abstract
    Traditionally, design and analysis techniques have been using abstractions and models that are well captured using probabilistic models and are treated using standard algorithmic techniques. However, technology progress and application diversification, created a need for considering the impact of non-Gaussian and non-uniform uncertainty distributions that can only be addressed using non-parametric statistical techniques and robust algorithms. This trend provided an impetus for creation of a new graduate level course that aims to teach students sound statistical techniques, to enable them to obtain hands-on experience using statistical software, and to develop and apply the most effective ways to address design and manufacturing uncertainties. We summarize the syllabus of the course that integrates statistical techniques in the design curriculum, identifying the major obstacles and suggesting future improvements.
  • Keywords
    design engineering; educational courses; engineering education; nonparametric statistics; statistical analysis; statistical distributions; teaching; design curriculum; design uncertainties; graduate level course; manufacturing uncertainties; nonGaussian distribution; nonparametric statistical techniques; nonuniform uncertainty distributions; probabilistic models; standard algorithmic techniques; statistical software; statistical techniques; teaching; Algorithm design and analysis; Application software; Large scale integration; Microelectronics; Parametric statistics; Power system modeling; Predictive models; Semiconductor device modeling; Uncertainty; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Systems Education, 2007. MSE '07. IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7695-2849-X
  • Type

    conf

  • DOI
    10.1109/MSE.2007.54
  • Filename
    4231494