Title :
A Robust Solution for Embedded Memory Test and Repair
Author :
Darbinyan, K. ; Harutyunyan, G. ; Shoukourian, S. ; Vardanian, V. ; Zorian, Y.
Author_Institution :
Synopsys, Mountain View, CA, USA
Abstract :
This paper presents a robust solution for test and repair of embedded memories. The STAR (Self-Test and Repair) Memory System solution is developed within Synopsys Design Ware allowing users to create, integrate and verify embedded memory test and repair IP in system on chips. The key components and features of the SMS are discussed.
Keywords :
embedded systems; integrated circuit testing; random-access storage; SMS; STAR memory system solution; Synopsys DesignWare; embedded memory repair; embedded memory test; self-test and repair memory system solution; Algorithm design and analysis; Built-in self-test; Circuit faults; Conferences; Maintenance engineering; Manufacturing; System-on-a-chip; SMS; built-in self-test; embedded test and repair; memory BIST; test algorithms;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
DOI :
10.1109/ATS.2011.98
