• DocumentCode
    2804802
  • Title

    Integrated phototransistors in a CMOS process for optoelectronic integrated circuits

  • Author

    Kostov, Plamen ; Gaberl, Wolfgang ; Zimmermann, Horst

  • Author_Institution
    Inst. of Electrodynamics, Vienna Univ. of Technol., Vienna, Austria
  • fYear
    2010
  • fDate
    14-16 Sept. 2010
  • Firstpage
    250
  • Lastpage
    253
  • Abstract
    This work presents integrated pnp phototransistors built in a 0.6 μm OPTO ASIC CMOS process using a low doped epi wafer as starting material. Several phototransistors with different designs of the base and emitter area were realized and characterized. For these novel photodetectors responsivities up to 65 A/W for DC light and up to 37.2 A/W for modulated light were achieved. Other transistors reach bandwidths up to 14 MHz. Due to the used standard silicon CMOS process low-cost integration is possible. Analog and digital circuitry can be implemented together with active optical detectors. This paves the way for high performance optical sensors and cost efficient SoC devices. Typical application examples include highly sensitive optical sensors, active pixel image sensors, light barriers and optical distance measurement sensors as well as 3D cameras.
  • Keywords
    CMOS integrated circuits; image sensors; integrated optoelectronics; optical sensors; phototransistors; system-on-chip; 3D cameras; DC light; OPTO ASIC CMOS process; SoC devices; active optical detectors; active pixel image sensors; analog circuitry; digital circuitry; integrated pnp phototransistors; light barriers; low doped epi wafer; low-cost integration; optical distance measurement sensors; optical sensors; optoelectronic integrated circuits; silicon CMOS process; size 0.6 mum; Bandwidth; Current measurement; Optical attenuators; Optical sensors; Optical variables measurement; Phototransistors; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European
  • Conference_Location
    Sevilla
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4244-6658-0
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2010.5618374
  • Filename
    5618374