DocumentCode :
2805170
Title :
Analysis of IGBT power cycling capabilities used in Doubly Fed Induction Generator wind power system
Author :
Wei, Lixiang ; Kerkman, Russ J. ; Lukaszewski, Richard A. ; Lu, Haihui ; Yuan, Zhenhuan
Author_Institution :
Rockwell Autom. - Allen Bradley, Mequon, WI, USA
fYear :
2010
fDate :
12-16 Sept. 2010
Firstpage :
3076
Lastpage :
3083
Abstract :
The Doubly Fed Induction Generator (DFIG) is one of the most popular topologies applied in wind power systems. Its main advantage is to adjust the speed of a large system with much lower power converters. This is because its rotor side converter (RSC) operates under slip frequency and it needs only to support slip power to the overall system. However, this slip frequency is much lower than the grid frequency and IGBTs in the RSC are susceptible to power cycling failures. This paper provides a method to analyze the power cycle capability of a DFIG power converter under wind power applications. Different current control methods, including minimal stator losses, minimal rotor losses and minimal overall losses, are analyzed and compared. It is verified that the sizes of the IGBT must be selected appropriately to avoid earlier power cycling failures. Designing a wind power converter into the targeted system is critical for cost reduction without sacrificing the reliability of the whole system.
Keywords :
asynchronous generators; insulated gate bipolar transistors; power convertors; wind power plants; DFIG power converter; IGBT power cycling capability analysis; RSC; cost reduction; current control methods; doubly fed induction generator wind power system; low power converters; minimal rotor losses; minimal stator losses; power cycling failures; rotor side converter; slip frequency; Converters; Equations; Insulated gate bipolar transistors; Rotors; Stator windings; Wind speed; ΔTj control; Doubly Fed Induction Generator; MTTF; Power cycling capability; adjustable speed drive;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-5286-6
Electronic_ISBN :
978-1-4244-5287-3
Type :
conf
DOI :
10.1109/ECCE.2010.5618396
Filename :
5618396
Link To Document :
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