DocumentCode
2805740
Title
Spherical near-field scanning: determining the incident field near a rotatable probe
Author
Wittmann, R.C.
Author_Institution
NIST, Boulder, CO, USA
fYear
1990
fDate
7-11 May 1990
Firstpage
224
Abstract
A spherical near-field scanning algorithm is developed for determining incident fields inside a probe´s minimum sphere. This differs from the well-known spherical near-field scanning formulation which determines fields outside the source´s minimum sphere. The scanner size depends on the extent of the region of interest and not on the extent of the (possibly much larger) source. The data can be collected using a standard roll-over-azimuth positioner. The practical implementation of this technique is discussed.<>
Keywords
antenna radiation patterns; electric sensing devices; field strength measurement; probes; antenna measurements; incident field; incident fields; rotatable probe; spherical near-field scanning algorithm; Antenna measurements; Electromagnetic compatibility; Electromagnetic interference; Equations; Error analysis; Lighting; Metrology; Probes; System testing; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1990. AP-S. Merging Technologies for the 90's. Digest.
Conference_Location
Dallas, TX, USA
Type
conf
DOI
10.1109/APS.1990.115088
Filename
115088
Link To Document