Adaptive system-level diagnosis and its application

System-level diagnosis is known for decades, and many solid results have been provided for this problem. This paper presents a new adaptive diagnosis strategy which requires far fewer tests than previous methods. Since tests can be applied concurrently in this method, the total time span for fault location can be further reduced. Although the practical implications of system-level diagnosis is few, we find the adaptive diagnosis useful in locating faults in field-programmable gate array (FPGA). We show this application in this paper