DocumentCode
2806936
Title
Sixth International Workshop on Microprocessor Test and Verification - Title
fYear
2005
fDate
3-5 Nov. 2005
Abstract
The following topics are dealt with: automatic test pattern generation; network-on-chip, integrated circuit testing; and microprocessor chips
Keywords
automatic test pattern generation; integrated circuit testing; microprocessor chips; network-on-chip; automatic test pattern generation; integrated circuit testing; microprocessor chips; network-on-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocessor Test and Verification, 2005. MTV '05. Sixth International Workshop on
Conference_Location
Austin, TX
ISSN
1550-4093
Print_ISBN
0-7695-2627-6
Type
conf
DOI
10.1109/MTV.2005.27
Filename
4022215
Link To Document