• DocumentCode
    2807909
  • Title

    A V-I slope-based method for flicker source detection

  • Author

    Nassif, Alexandre B. ; Nino, Edwin E. ; Xu, Wilsun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
  • fYear
    2005
  • fDate
    23-25 Oct. 2005
  • Firstpage
    364
  • Lastpage
    367
  • Abstract
    Flicker can be defined as the impression of unsteadiness of visual sensation induced by a light stimulus whose luminance or spectral distribution fluctuates with time. The flicker source detection is an important step in the power quality evaluation process as only after the information about the disturbance location is available, the diagnosis and troubleshooting can be accordingly carried out. This paper is concerned about the flicker source detection subject. The problem is described, the method is proposed and shown to be comprehensive enough to diagnose stationary and random flicker. Analytical proof, a simulation and a practical case assembled in laboratory are presented to show the validity of the method. Its principle is based in the relationship between voltage and current rms values, and it is possible to show that the behavior of this relationship permits one to draw conclusions about the flicker source.
  • Keywords
    fault location; power supply quality; V-I slope-based method; disturbance location; flicker source detection; power quality evaluation process; spectral distribution; Analytical models; Assembly; Frequency; Furnaces; Industrial plants; Laboratories; Power industry; Power quality; Power systems; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Symposium, 2005. Proceedings of the 37th Annual North American
  • Print_ISBN
    0-7803-9255-8
  • Type

    conf

  • DOI
    10.1109/NAPS.2005.1560560
  • Filename
    1560560