• DocumentCode
    2809030
  • Title

    A study on properties of SAW and the magnetic thin-film bond

  • Author

    Choi, Jeong-Sik ; Moon, Jong-Dae ; So, Cheol-Ho ; Cha, In Su

  • Author_Institution
    Dept. of Electr. & Opt. Electron. Eng., Dongshin Univ., Naju, South Korea
  • fYear
    2003
  • fDate
    28-30 May 2003
  • Firstpage
    179
  • Lastpage
    180
  • Abstract
    We manufactured photo mask to make surface acoustic wave (SAW) filter that use special quality of these LiNbO3 piezoelectric material (100). To make IDT electrode, we evaporated aluminum about 6000 Å, and achieved lithography process by using e-beam evaporator. Filament evaporation method was selected to evaporate nickel magnetic thin film between Tx-IDT terminal and Rx-IDT terminal. Thickness of evaporated nickel was about 4000 Å. Width of IDT electrode that is used here are 50 μm and space between IDT electrodes is 50 μm. Metal piece is 8 pair, the length of metal piece is 8 mm and the whole size is 52 mm×24 mm. The calculated SAW is 200 μm. It is confirmed that manufactured LiNbO3-IDT´s center frequency is 18.1 MHz. The average velocity of SAW, that propagates LiNbO3-IDT´s Tx-IDT and Rx-IDT both terminal, measured v=3888±2.565m/s. And SAW´s average velocity, that propagates LiNbO3-Ni-IDT´s Tx-IDT and Rx-IDT both terminal, measured v=3827±1.474m/s. While SAW passing magnetic thin films, its velocity decreased about 1.5% (61m/s).
  • Keywords
    acoustic wave velocity; interdigital transducers; lithium compounds; lithography; magnetic thin films; masks; nickel; piezoelectric materials; surface acoustic wave filters; 18.1 MHz; 3827 m/s; 3888 m/s; 4000 Å; 50 micron; 61 m/s; 8 mm; IDT electrode; LiNbO3; Ni; SAW; aluminum evaporation; e-beam evaporation; filament evaporation; lithography; magnetic thin film bond; nickel magnetic thin film; photomask; piezoelectric material; surface acoustic wave filter; Acoustic waves; Bonding; Electrodes; Magnetic films; Magnetic properties; Magnetic separation; Manufacturing; Nickel; Surface acoustic waves; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics, 2003 4th IEEE International Conference on
  • Print_ISBN
    0-7803-7699-4
  • Type

    conf

  • DOI
    10.1109/IVEC.2003.1286223
  • Filename
    1286223