DocumentCode
2809652
Title
Pulsed laser validation of recovery mechanisms of critical SEE´s in an artificial neural network system
Author
Buchner, S. ; Olmos, M. ; Cheynet, Ph. ; Velazco, R. ; McMorrow, D. ; Melinger, J. ; Ecoffet, R. ; Muller, J.D.
Author_Institution
SFA Inc., Washington, DC, USA
fYear
1997
fDate
15-19 Sep 1997
Firstpage
353
Lastpage
359
Abstract
A pulsed laser was used to inject errors into an electronic system consisting of a number of different integrated circuits functioning as a digital version of an artificial neural network. The results confirm that the system as a whole can operate autonomously in the radiation environment of space. Additional work was done to characterize the effects of the upsets on the output of the artificial neural network
Keywords
laser beam effects; neural chips; radiation hardening (electronics); recovery; space vehicle electronics; artificial neural network; digital integrated circuit; electronic system; error; pulsed laser irradiation; recovery; single event effect; single event upset; space radiation environment; Aerospace engineering; Artificial neural networks; Extraterrestrial measurements; Intelligent networks; Laboratories; Life estimation; Optical pulses; Pulse measurements; Single event upset; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location
Cannes
Print_ISBN
0-7803-4071-X
Type
conf
DOI
10.1109/RADECS.1997.698934
Filename
698934
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