Title :
IEE Colloquium on `Application and Development of the Boundary-Scan Standard´ (Digest No.183)
Abstract :
The following topics were dealt with: ANSI/IEEE standard; JTAG; memory controllers; system level test; ASICs; fault algorithms; IED
Keywords :
application specific integrated circuits; automatic testing; integrated circuit testing; logic testing; printed circuit testing; ANSI/IEEE standard; ASICs; IED; JTAG; fault algorithms; memory controllers; system level test;
Conference_Titel :
Application and Development of the Boundary-Scan Standard, IEE Colloquium on
Conference_Location :
London
