DocumentCode
280996
Title
IEE Colloquium on `Application and Development of the Boundary-Scan Standard´ (Digest No.183)
fYear
1990
fDate
33226
Abstract
The following topics were dealt with: ANSI/IEEE standard; JTAG; memory controllers; system level test; ASICs; fault algorithms; IED
Keywords
application specific integrated circuits; automatic testing; integrated circuit testing; logic testing; printed circuit testing; ANSI/IEEE standard; ASICs; IED; JTAG; fault algorithms; memory controllers; system level test;
fLanguage
English
Publisher
iet
Conference_Titel
Application and Development of the Boundary-Scan Standard, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
191489
Link To Document