DocumentCode :
2810961
Title :
The new department of defense (DoD) guide for achieving and assessing RAM
Author :
Jackson, Yvonne ; Tabbagh, Peter ; Gibson, Paul ; Seglie, Ernest
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
1
Lastpage :
7
Keywords :
data analysis; maintenance engineering; military systems; product design; reliability; statistical analysis; Department of Defense; RAM guide; data analysis; defense acquisition; operation testing; product design; reliability availability and maintainability guide; statistical issue; Availability; Data analysis; Degradation; Life testing; Maintenance; Manufacturing; Product design; Statistical analysis; System testing; US Department of Defense;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408329
Filename :
1408329
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2810961
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