• DocumentCode
    2811935
  • Title

    The DARPA Diverse Accessible Heterogeneous Integration (DAHI) program: Convergence of compound semiconductor devices and silicon-enabled architectures

  • Author

    Raman, S. ; Dohrman, Carl L. ; Tsu-Hsi Chang

  • Author_Institution
    U.S. Defense Adv. Res. Projects Agency (DARPA), Arlington, VA, USA
  • fYear
    2012
  • fDate
    21-23 Nov. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The DARPA Diverse Accessible Heterogeneous Integration (DAHI) program is developing transistor-scale heterogeneous integration processes to intimately combine advanced compound semiconductor (CS) devices, as well as other emerging materials and devices, with high-density silicon CMOS technology. This technology is currently enabling RF/mixed signal circuits with revolutionary performance. For example, InP HBT + CMOS technology is being utilized in advanced DACs and ADCs with CMOS-enabled calibration and self-healing techniques for correcting static and dynamic errors in situ. Such CMOS-enabled self-healing techniques are expected to more generally enable improved CS-based circuit performance and yield in the presence of process and environmental variability, as well as aging. DAHI is also expected to enable the integration of high power CS devices with silicon-based linearization techniques to realize highly power efficient transmitters. By enabling this heterogeneous integration capability, DAHI seeks to establish a new paradigm for microsystems designers to utilize a diverse array of materials and device technologies on a common silicon-based platform.
  • Keywords
    CMOS integrated circuits; III-V semiconductors; analogue-digital conversion; digital-analogue conversion; indium compounds; linearisation techniques; mixed analogue-digital integrated circuits; semiconductor device models; silicon; ADC; CMOS-enabled calibration; CMOS-enabled self-healing technique; CS-based circuit performance; DAC; DAHI program; DARPA; HBT; InP; RF/mixed signal circuit; Si; aging; compound semiconductor device; diverse accessible heterogeneous integration; dynamic error; high power CS device; high-density silicon CMOS technology; highly power efficient transmitter; microsystem; silicon-based linearization technique; silicon-enabled architecture; static error; transistor-scale heterogeneous integration process; CMOS integrated circuits; Foundries; Gallium nitride; Indium phosphide; Radio frequency; Silicon; ADC; Compound semiconductor; DACac; FPA; HBT; InP; ROIC; Si CMOS; foundry; heterogeneous integration; linearization; mixed signal circuit; multi-project wafer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology (RFIT), 2012 IEEE International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-2303-1
  • Type

    conf

  • DOI
    10.1109/RFIT.2012.6401596
  • Filename
    6401596