• DocumentCode
    2812158
  • Title

    Bimetallic Thin Film Grayscale Photomasks for Complex 3D Microstructure Creation in SU-8

  • Author

    Wang, Jun ; Dykes, James M. ; Choo, Chinheng ; Poon, David K. ; Chang, Marian ; Tsui, Jimmy T K ; Chapman, Glenn H.

  • Author_Institution
    Simon Fraser Univ., Burnaby
  • fYear
    2007
  • fDate
    22-26 April 2007
  • Firstpage
    959
  • Lastpage
    962
  • Abstract
    Metallic thin films can be fully oxidized by focused laser beams, resulting in their optical density (OD) changing from highly absorbing to very transparent. Previous research found the laser-induced partial oxidation process allows the creation of grayscale photomasks. This work investigates Sn/Zn, Zn/Al and In/Zn thin films, which are DC/RF-sputter deposited and then scanned by an argon ion CW laser. The resulting transmittance for the mask varies from 0.06% (3.2 OD) to 63% (0.2 OD), offering a greater range of transparency at I-line (365 nm) than existing commercial grayscale masks such as chrome halftone binary and analog HEBS photomasks. Having 8-bit gray level precision, bimetallic films are capable of producing complex 3D microstructures using only a single exposure. Using SU-8, a thick negative photoresist, along with standard photolithography, microfeatures with height variations up to 100 mum were successfully generated.
  • Keywords
    aluminium alloys; bimetals; indium alloys; laser materials processing; masks; metallic thin films; oxidation; photoresists; sputter deposition; tin alloys; transparency; zinc alloys; DC/RF-sputter deposited; In-Zn; SU-8; Sn-Zn; Zn-Al; bimetallic thin film grayscale photomasks; complex 3D microstructure; focused laser beams; laser-induced partial oxidation; optical density; photolithography; photoresist; transmittance; transparency; Argon; Gray-scale; Laser beams; Microstructure; Optical films; Oxidation; Sputtering; Tin; Transistors; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2007. CCECE 2007. Canadian Conference on
  • Conference_Location
    Vancouver, BC
  • ISSN
    0840-7789
  • Print_ISBN
    1-4244-1020-7
  • Electronic_ISBN
    0840-7789
  • Type

    conf

  • DOI
    10.1109/CCECE.2007.245
  • Filename
    4232904