DocumentCode
2812158
Title
Bimetallic Thin Film Grayscale Photomasks for Complex 3D Microstructure Creation in SU-8
Author
Wang, Jun ; Dykes, James M. ; Choo, Chinheng ; Poon, David K. ; Chang, Marian ; Tsui, Jimmy T K ; Chapman, Glenn H.
Author_Institution
Simon Fraser Univ., Burnaby
fYear
2007
fDate
22-26 April 2007
Firstpage
959
Lastpage
962
Abstract
Metallic thin films can be fully oxidized by focused laser beams, resulting in their optical density (OD) changing from highly absorbing to very transparent. Previous research found the laser-induced partial oxidation process allows the creation of grayscale photomasks. This work investigates Sn/Zn, Zn/Al and In/Zn thin films, which are DC/RF-sputter deposited and then scanned by an argon ion CW laser. The resulting transmittance for the mask varies from 0.06% (3.2 OD) to 63% (0.2 OD), offering a greater range of transparency at I-line (365 nm) than existing commercial grayscale masks such as chrome halftone binary and analog HEBS photomasks. Having 8-bit gray level precision, bimetallic films are capable of producing complex 3D microstructures using only a single exposure. Using SU-8, a thick negative photoresist, along with standard photolithography, microfeatures with height variations up to 100 mum were successfully generated.
Keywords
aluminium alloys; bimetals; indium alloys; laser materials processing; masks; metallic thin films; oxidation; photoresists; sputter deposition; tin alloys; transparency; zinc alloys; DC/RF-sputter deposited; In-Zn; SU-8; Sn-Zn; Zn-Al; bimetallic thin film grayscale photomasks; complex 3D microstructure; focused laser beams; laser-induced partial oxidation; optical density; photolithography; photoresist; transmittance; transparency; Argon; Gray-scale; Laser beams; Microstructure; Optical films; Oxidation; Sputtering; Tin; Transistors; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 2007. CCECE 2007. Canadian Conference on
Conference_Location
Vancouver, BC
ISSN
0840-7789
Print_ISBN
1-4244-1020-7
Electronic_ISBN
0840-7789
Type
conf
DOI
10.1109/CCECE.2007.245
Filename
4232904
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