DocumentCode :
2812888
Title :
Improvement of sequential probability ratio tests by acceleration and automation of test planning
Author :
Krasich, Milena
Author_Institution :
Automotive Syst. Div., Bose Corp., Framingham, MA, USA
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
475
Lastpage :
481
Keywords :
failure analysis; life testing; production planning; production testing; reliability; risk analysis; statistical testing; MTBF; accelerated sequential testing; consumers risk; environmental stresses; failure rate; minimum test duration; minimum test time; planning automation; probability; producers risk; product reliability; test termination; Automatic testing; Automation; Costs; Degradation; Life estimation; Manufacturing processes; Materials reliability; Production; Sequential analysis; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408408
Filename :
1408408
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2812888
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