Title :
Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory
Author :
McClure, Steven S. ; Allen, Gregory R. ; Irom, Farokh ; Scheick, Leif Z. ; Adell, Philippe C. ; Miyahira, Tetsuo F.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests for a variety of microelectronic devices. The compendium covers devices tested over the last two years by the Jet Propulsion Laboratory.
Keywords :
integrated circuit testing; Jet Propulsion Laboratory; SEE test; heavy ion-induced single event effect; microelectronic devices; proton-induced single event effect; single event effect test; CMOS integrated circuits; CMOS technology; Performance evaluation; SDRAM; Single event upset; Voltage control;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619495
