Title :
IEE Colloquium on `Instrumentation in Electronic Product Manufacture´ (Digest No.70)
Abstract :
The following topics were dealt with: standard test apparatus; logic analysers; electronic components testing; production testing; VXI bus; and ATE
Keywords :
automatic test equipment; computer interfaces; electronic equipment testing; logic testing; production testing; ATE; VXI bus; electronic components testing; logic analysers; production testing; standard test apparatus;
Conference_Titel :
Instrumentation in Electronic Product Manufacture, IEE Colloquium on
Conference_Location :
London
