Title :
Investigating the Impact of Pulsed Power Charging Demands on Shipboard Power Quality
Author :
Steurer, M. ; Andrus, M. ; Langston, J. ; Qi, L. ; Suryanarayanan, S. ; Woodruff, S. ; Ribeiro, P.F.
Author_Institution :
Florida State Univ., Tallahassee
Abstract :
The impact of pulsed power loads on shipboard power systems need to be properly determined to prevent pulsed loads from causing unacceptable power quality deviations, interference with other loads and degradation of overall system performance. This paper uses a high fidelity modeling and simulation approach to investigate the impact of real and reactive power, pulse ramp rate, pulse duration and frequency of occurrence of the pulsed power load. For this purpose, a notional shipboard power system, modeled in a real-time digital simulator, is used. Most pulsed loads on shipboard systems are not fed directly from the prime power system but via an energy storage system. This energy storage system in turn is interfaced with the shipboard prime power system typically through an electronic front-end charging circuit. In order to evaluate the impact of pulsed loads, existing power quality standards (related to voltage transients, harmonic distortions, and frequency variations) are applied.
Keywords :
energy storage; power supply quality; power system simulation; pulsed power technology; reactive power; ships; electronic front-end charging circuit; energy storage system; frequency variations; harmonic distortions; pulse duration; pulse ramp rate; pulsed power charging demands; pulsed power loads impact; reactive power; real-time digital simulator; shipboard power quality; shipboard power systems; unacceptable power quality; voltage transients; Degradation; Energy storage; Frequency; Interference; Power quality; Power system harmonics; Power system modeling; Power system simulation; Power system transients; Pulse power systems; modeling and simulation; power quality; pulse power; shipboard power systems;
Conference_Titel :
Electric Ship Technologies Symposium, 2007. ESTS '07. IEEE
Conference_Location :
Arlington, VA
Print_ISBN :
1-4244-0947-0
Electronic_ISBN :
1-4244-0947-0
DOI :
10.1109/ESTS.2007.372104