• DocumentCode
    2820111
  • Title

    Implementation of JVM tool interface on Dalvik virtual machine

  • Author

    Chang, Chien-Wei ; Lin, Chun-Yu ; King, Chung-Ta ; Chung, Yi-Fan ; Tseng, Shau-Yin

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    26-29 April 2010
  • Firstpage
    143
  • Lastpage
    146
  • Abstract
    Mobile devices such as cell phones, GPS guiding systems, and mp3 players, now become one of the most important consumer electronic products. Being an embedded system, mobile devices are highly integrated in software and hardware for robustness, high performance, and low cost. The problem is that this also makes it very difficult to understand the internal interactions of hardware as well as software modules in such devices and to identify performance bottlenecks and design faults. Profiling helps developers to understand the behaviors of a system, especially during the development of new platforms. Android is a new software platform intended for mobile devices. It is composed of Linux and a Java virtual machine called Dalvik. The ability to profile Android helps developers to familiarize with Android´s features and optimize their applications. In this paper, we discuss the development of a profiling tool interface, JVM TI, on Android. With this tool interface, developers can profile their Java code running on Dalvik using JVM TI.
  • Keywords
    Java; Linux; embedded systems; mobile handsets; software tools; virtual machines; Android; Dalvik virtual machine; JVM TI; JVM tool interface; Java virtual machine; Linux; embedded system; mobile devices; software platform; Cellular phones; Consumer electronics; Embedded software; Embedded system; Global Positioning System; Hardware; Java; Robustness; Software performance; Virtual machining; Dalvik virtual machine; Embeded systen; Google Android; JAVA; JVM TI; Profiling tool;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
  • Conference_Location
    Hsin Chu
  • Print_ISBN
    978-1-4244-5269-9
  • Electronic_ISBN
    978-1-4244-5271-2
  • Type

    conf

  • DOI
    10.1109/VDAT.2010.5496711
  • Filename
    5496711