Title :
Variability analysis of a digitally trimmable ultra-low power voltage reference
Author :
Seok, Mingoo ; Kim, Gyouho ; Blaauw, David ; Sylvester, Dennis
Author_Institution :
EECS, Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
A digitally trimmable voltage reference is proposed, achieving a tight distribution of temperature coefficient and output voltage, along with pA-range current consumption for Vdd=0.5-3.0V. Using 2 temperature point digital trimming, the temperature coefficient and nominal output voltage are within 5.3-47.4ppm/°C and 175.2-176.5mV across 25 dies in 0.13μm CMOS. Non-trimmable versions are also implemented in 0.13μm and 0.18μm technologies to study process variations across multiple runs and technology portability of the design.
Keywords :
CMOS integrated circuits; low-power electronics; 2 temperature point digital trimming; CMOS; digitally trimmable ultra-low power voltage reference; nominal output voltage; pA-range current consumption; size 0.13 mum; temperature coefficient; variability analysis; voltage 0.5 V to 3 V; voltage 175.2 mV to 176.5 mV; Biomedical measurements; CMOS integrated circuits; Capacitors; Noise; Power measurement; Temperature measurement; Voltage measurement;
Conference_Titel :
ESSCIRC, 2010 Proceedings of the
Conference_Location :
Seville
Print_ISBN :
978-1-4244-6662-7
DOI :
10.1109/ESSCIRC.2010.5619816
