DocumentCode
2823930
Title
The effect of lapping method on the thermal reliability of a GMR head based on Black´s equation
Author
Yufeng Li ; Meyer, D.
Author_Institution
Read-Rite Corp., Milpitas, CA, USA
fYear
2000
fDate
6-8 Nov. 2000
Abstract
The thermal reliability of a GMR head is described by Black´s equation. In this paper the temperature of a GMRE is studied as a function of lapping process and bias current for two different lapping techniques used for stripe height control: electrical lapping guide and magnetic device resistance. Based on measurements of the electric resistance, it is found that the temperature rise is proportional to the square of electric current density, not to the power consumption as conventionally perceived.
Keywords
giant magnetoresistance; magnetic heads; magnetoresistive devices; reliability; Black equation; GMR head; GMRE; bias current; electric resistance; electrical lapping guide; lapping method; magnetic device resistance; stripe height control; thermal reliability; Current measurement; Density measurement; Electric resistance; Electrical resistance measurement; Equations; Lapping; Magnetic devices; Magnetic heads; Power measurement; Temperature control;
fLanguage
English
Publisher
ieee
Conference_Titel
Asia-Pacific Magnetic Recording Conference, 2000. APMRC 2000
Conference_Location
Tokyo, Japan
Print_ISBN
0-7803-6254-3
Type
conf
DOI
10.1109/APMRC.2000.898939
Filename
898939
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