DocumentCode
2823934
Title
SSIM-based non-local means image denoising
Author
Rehman, Abdul ; Wang, Zhou
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
fYear
2011
fDate
11-14 Sept. 2011
Firstpage
217
Lastpage
220
Abstract
Perceptually inspired image processing has been an emerging field of study in recent years. Here we make one of the first efforts to incorporate the structural similarity (SSIM) index, a successful perceptual image quality assessment measure, into the framework of non-local means (NLM) image denoising, which is a state-of-the-art method that delivers superior desnoising performance. Specifically, a denoised image patch is obtained by weighted averaging of neighboring patches, where the similarity between patches as well as the weights assigned to the patches are determined based on an estimation of SSIM. A two-stage approach is proposed for robust SSIM estimation in the presence of noise. Moreover, motivated by the ideas behind SSIM, we adjust the contrast and mean of each patch before feeding it into the weighted averaging process. Our experimental results show that the proposed SSIM-based NLM algorithm achieves better SSIM and PSNR performance and provides better visual quality than least square based NLM method.
Keywords
image denoising; image matching; least squares approximations; visual perception; SSIM-based NLM algorithm; SSIM-based nonlocal mean image denoising; least square based NLM method; perceptual image quality assessment; perceptually inspired image processing; robust SSIM estimation; state-of-the-art method; structural similarity index; superior desnoising performance; two-stage approach; visual quality; weighted averaging process; Conferences; Image denoising; Noise measurement; Noise reduction; PSNR; image denoising; non-local means; perceptual image processing; structural similarity;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2011 18th IEEE International Conference on
Conference_Location
Brussels
ISSN
1522-4880
Print_ISBN
978-1-4577-1304-0
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2011.6116065
Filename
6116065
Link To Document