DocumentCode :
2824506
Title :
Hot lot management: minimizing cycle time in batch processes
Author :
Gupta, A.K. ; Ganesan, V.K. ; Sivakumar, A.I.
Author_Institution :
Sch. of Mech. & Production Eng., Nanyang Technol. Univ., Singapore
Volume :
3
fYear :
2004
fDate :
18-21 Oct. 2004
Firstpage :
1217
Abstract :
In semiconductor manufacturing, hot lots are often introduced into the system out of marketing and business considerations for extra flexibility regarding delivery lead times. The objective of this paper is to study the scheduling policies to minimize the cycle time of hot lots in batch processes. We present three scheduling policies based on look ahead batching (LAB) and study their effect on the performance of cycle time of hot lots and other priority lots in the system. In LAB, the scheduling decisions are based on the arrival epochs of incoming lots, which are easily predictable in a computer integrated manufacturing environment. The steady state simulation results show that exploiting the knowledge of future arrivals leads to 10% reduction in the cycle time of hot lots without affecting their standard deviation and also without affecting the cycle time performance of other priority lots in batch processes at lower values of utilization level.
Keywords :
batch processing (industrial); computer integrated manufacturing; production engineering computing; scheduling; semiconductor device manufacture; batch process; computer integrated manufacturing environment; cycle time minimization; hot lot management; look ahead batching; scheduling; semiconductor manufacturing; Computer integrated manufacturing; Control systems; Electronics industry; Fabrication; Furnaces; Job shop scheduling; Manufacturing processes; Processor scheduling; Semiconductor device manufacture; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering Management Conference, 2004. Proceedings. 2004 IEEE International
Print_ISBN :
0-7803-8519-5
Type :
conf
DOI :
10.1109/IEMC.2004.1408887
Filename :
1408887
Link To Document :
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