Title :
TUFTsim: a multiple domain simulator for experimentation
Author :
Heller, Jamie A. ; Lentz, Karen Panetta
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA
Abstract :
TUFTsim is a multilevel multiple domain concurrent simulator that is able to investigate and detect scenarios of behavior. A scenario is a combination of individual behavior or points of failure. As a behavior propagates through a model, it has the possibility of colliding into another behavior at a common node or juncture. The result of a collision may produce a new combined behavior. The inherent features of concurrent simulation provides the simulator with the ability to track fault signatures, while simultaneously providing experiment observation capabilities. In this paper we present the algorithms that allow scenarios of experiments to be efficiently created and simulated. Using single stuck-at faults, we discuss the issues of dynamically creating multiple stuck-at-fault scenarios
Keywords :
circuit simulation; fault diagnosis; logic testing; TUFTsim; algorithms; behaviour scenarios; collision; combined behavior; experimentation; failure; fault signature tracking; multilevel multiple domain concurrent simulator; single stuck-at faults; Computational modeling; Computer crashes; Computer science; Fault diagnosis; Observability; Roads;
Conference_Titel :
Simulation Symposium, 1999. Proceedings. 32nd Annual
Conference_Location :
San Diego, CA
Print_ISBN :
0-7695-0128-1
DOI :
10.1109/SIMSYM.1999.766453