مرکز منطقه ای اطلاع رساني علوم و فناوري - 2004 IEEE International Workshop on Defect Based Testing ( DBT)

DocumentCode :

2825286

Title :

2004 IEEE International Workshop on Defect Based Testing ( DBT) - Cover

fYear :

2004

fDate :

25-25 April 2004

Abstract :

Presents the front cover or splash screen of the proceedings.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on

Conference_Location :

Napa Valley, CA

Print_ISBN :

0-7803-8950-6

Type :

conf

DOI :

10.1109/DBT.2004.1408934

Filename :

1408934

Link To Document :