DocumentCode
2825331
Title
Copyright
fYear
2004
fDate
25-25 April 2004
Abstract
Copyright and Reprint Permissions: Abstracting is permitted with credit to the source. Libraries may photocopy beyond the limits of US copyright law, for private use of patrons, those articles in this volume that carry a code at the bottom of the first page, provided that the per-copy fee indicated in the code is paid through the Copyright Clearance Center. The papers in this book comprise the proceedings of the meeting mentioned on the cover and title page. They reflect the authors´ opinions and, in the interests of timely dissemination, are published as presented and without change. Their inclusion in this publication does not necessarily constitute endorsement by the editors or the Institute of Electrical and Electronics Engineers, Inc.
fLanguage
English
Publisher
ieee
Conference_Titel
Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on
Conference_Location
Napa Valley, CA
Print_ISBN
0-7803-8950-6
Type
conf
DOI
10.1109/DBT.2004.1408937
Filename
1408937
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