مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2825373

Title :

Welcome message

fYear :

2004

fDate :

25-25 April 2004

Abstract :

Presents the welcome message from the conference proceedings.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on

Conference_Location :

Napa Valley, CA

Print_ISBN :

0-7803-8950-6

Type :

conf

DOI :

10.1109/DBT.2004.1408939

Filename :

1408939

Link To Document :