Fast testing technique for multibeam antennas

Recently, the problem of exhaustive testing of the high number of multi beam antennas embarked on future satellite systems has received considerable attention. Based on conventional measurement techniques this testing would lead to unacceptable cost and duration. The use of fast probe array technology to replace the spatial dimension of the measurements is a proven solution to drastically reduce the measurement time compared to conventional single probe test systems. Another solution to reduce the overall measurement time consists in measuring several beams simultaneously instead of sequentially. This paper presents an innovative hardware solution to virtually reduce the number of antenna ports to be measured by characterizing several beams of a multi-beam antenna at the same time. The solution is applicable to both the receive and the transmit modes. This technique has been demonstrated by the manufacturing, installation and test of a full size demonstrator at Thales Alenia Space in Cannes and at Intespace in Toulouse.