• DocumentCode
    2825599
  • Title

    Simulation based cause and effect analysis of cycle time distribution in semiconductor backend

  • Author

    Sivakumar, Appa Iyer

  • Author_Institution
    Gintic Inst. of Manuf. Technol., Nanyang Technol. Inst., Singapore
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1464
  • Abstract
    We analyzed the effect of a number of controllable input parameters on cycle time distribution and other output variables in a complex semiconductor backend manufacturing system, using a data driven, discrete event simulation model. A validated model was used as the base case and the effects were quantified against the base model to analyze the relative merits and sensitivity of each of these input variables. Input variables that are analyzed include lot release controls, heuristic scheduling rules, machine up time, setup time, material handling time, product flow, and lot size. We have used actual data from a major semiconductor backend site for our analysis and showed the impact of lot release scheduling on cycle time distribution
  • Keywords
    discrete event simulation; electronic engineering computing; heuristic programming; production control; production engineering computing; semiconductor device manufacture; complex semiconductor backend manufacturing system; controllable input parameters; cycle time distribution; data driven discrete event simulation model; heuristic scheduling rule; lot release controls; lot release scheduling; lot size; machine up time; material handling time; product flow; sensitivity; setup time; simulation based cause and effect analysis; validated model; Analytical models; Assembly; Cause effect analysis; Discrete event simulation; Drives; Input variables; Integrated circuit testing; Manufacturing systems; Semiconductor device manufacture; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2000. Proceedings. Winter
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-6579-8
  • Type

    conf

  • DOI
    10.1109/WSC.2000.899127
  • Filename
    899127