DocumentCode
2827147
Title
Probability of Integrated Circuits Failures on Influence of Pulsed Radio-Wave Radiation
Author
Solodov, A.
Author_Institution
Radiotech. Inst., Russian Acad. of Sci., Moscow
Volume
2
fYear
2006
fDate
Sept. 2006
Firstpage
719
Lastpage
720
Abstract
A theoretical development of the damages accumulation model is presented. The probability and energy of IC damage is determined as a function of number of electromagnetic pulses N. This model qualitative describes the pulse repetition frequency dependence of failure probability and energy. It is necessary to change a model for quantitative coincidence with an experiment
Keywords
electromagnetic pulse; integrated circuit reliability; probability; radiowaves; IC damage; electromagnetic pulse; failure energy; integrated circuits failure probability; pulse repetition frequency; pulsed radio-wave radiation; quantitative coincidence; Pulse circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
966-7968-92-8
Electronic_ISBN
966-7968-92-8
Type
conf
DOI
10.1109/CRMICO.2006.256172
Filename
4023454
Link To Document