• DocumentCode
    2827751
  • Title

    Simulation-based design error diagnosis and correction in combinational digital circuits

  • Author

    Nayak, Debashis ; Walker, D.M.H.

  • Author_Institution
    Cadence Design Syst., Chelmsford, MA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    70
  • Lastpage
    78
  • Abstract
    This paper describes an approach to design error diagnosis and correction in combinational digital circuits. Our approach targets small errors introduced during the design process or due to specification changes. We incrementally use simulation to identify suspect nets, and then attempt correction based on our error model. We use multiple iterations to handle multiple errors. Experimental results on ISCAS´85 benchmarks are shown for circuits containing up to four random errors. Diagnosis and correction can be done quickly, with the bulk of the time going to diagnosis. Our tool is accurate in that even with multiple errors present, the corrected circuit is identical to the original most of the time
  • Keywords
    circuit simulation; combinational circuits; error correction; fault diagnosis; integrated circuit design; integrated circuit testing; iterative methods; logic testing; ISCAS´85 benchmarks; combinational digital circuits; design error correction; design error diagnosis; design process; error model; multiple errors; multiple iterations; random errors; simulation-based design error; specification changes; Binary decision diagrams; Circuit simulation; Circuit synthesis; Computational modeling; Computer errors; Computer science; Counting circuits; Digital circuits; Error correction; Process design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1999. Proceedings. 17th IEEE
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0146-X
  • Type

    conf

  • DOI
    10.1109/VTEST.1999.766649
  • Filename
    766649