DocumentCode :
2827932
Title :
Direct measurement of Dirac point and Fermi level at graphene/oxide interface by internal photoemission
Author :
Xu, Kun ; Zeng, Caifu ; Zhang, Qin ; Ye, Peide ; Wang, Kang ; Richter, Curt A. ; Gundlach, David ; Nguyen, Nhan V.
Author_Institution :
Semicond. & Dimensional Metrol. Div., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
2012
fDate :
18-20 June 2012
Firstpage :
1
Lastpage :
2
Abstract :
We report the first direct measurement of the Dirac point, the Fermi level, and the work function of single layer gapless graphene by using photoemission threshold spectroscopy. Since the pioneering work of Novoselov et al in 2004, [1] graphene has attracted an immense amount of interest from all disciplines. [2] The knowledge of the physics of graphene-based devices has grown dramatically. Along with the recent success of large area chemical vapor deposition (CVD) growth of graphene, [3] it seems the industrial applications such as transparent electrodes, [4] field effect transistors, [5] and quantum well devices [6] are becoming more promising. However, the precise position of the Dirac point and Fermi level at the graphene/oxide interface has yet to be investigated; despite their importance in the design and modeling of graphene-based devices. In this paper, we present the study of a semi-transparent metal/high-k/graphene/SiO2/Si structure, and focus our study on the photoemission phenomena at the graphene/SiO2 interface. As a result, a complete electronic band alignment of the graphene/SiO2/Si system is accurately constructed for the first time.
Keywords :
Fermi level; elemental semiconductors; graphene; interface states; photoelectron spectra; semiconductor-insulator boundaries; silicon; silicon compounds; work function; C-SiO2-Si; Dirac point position; Fermi level position; direct measurement; electronic band alignment; field effect transistors; graphene-based device design; graphene-based device modeling; graphene-based device physics; graphene-oxide interface; graphene-silica interface; graphene-silica-Si system; industrial applications; internal photoemission; large area chemical vapor deposition graphene growth; photoemission phenomena; photoemission threshold spectroscopy; quantum well devices; semitransparent metal/high-k/graphene/silica/Si structure; single layer gapless graphene; transparent electrodes; work function; High K dielectric materials; Logic gates; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2012 70th Annual
Conference_Location :
University Park, TX
ISSN :
1548-3770
Print_ISBN :
978-1-4673-1163-2
Type :
conf
DOI :
10.1109/DRC.2012.6256941
Filename :
6256941
Link To Document :
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