• DocumentCode
    2827965
  • Title

    High performance III–V FETs for low power CMOS applications

  • Author

    Radosavljevic, M.

  • Author_Institution
    Technol. & Manuf. Group, Intel Corp., Hillsboro, OR, USA
  • fYear
    2012
  • fDate
    18-20 June 2012
  • Firstpage
    193
  • Lastpage
    194
  • Abstract
    III-V compound semiconductor based quantum well field effect transistors are in general viewed as a promising transistor candidate for future high-speed low-power logic applications due to their excellent drive current performance at low voltage. In this presentation, I will review recent device developments of n-channel InGaAs transistors. To start, well-studied Schottky gate device architecture is adopted to demonstrate integration on Si substrate [1] as well as to establish performance advantages over state-of-the-art Si NMOS at VCC=0.5V [2]. To enable further LG scaling, high quality high-K dielectric is integrated [3] and non-planar Tri-gate architecture is implemented [4]. I will conclude by discussing InSb based p-channel device results [5], as well as InGaAs based tunnel FETs [6].
  • Keywords
    CMOS integrated circuits; III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; indium compounds; low-power electronics; semiconductor quantum wells; silicon; tunnel transistors; InGaAs; InSb; NMOS; Schottky gate device architecture; Si; drive current performance; field effect transistors; high quality high-K dielectric; low power CMOS applications; low power logic applications; nonplanar tri-gate architecture; semiconductor based quantum well; tunnel FET; voltage 0.5 V;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2012 70th Annual
  • Conference_Location
    University Park, TX
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4673-1163-2
  • Type

    conf

  • DOI
    10.1109/DRC.2012.6256943
  • Filename
    6256943