DocumentCode :
282971
Title :
Future devices for GaAs
Author :
Ladbrooke, P.H.
Author_Institution :
GEC Res. Ltd., Hirst Res. Centre, Wembley, UK
fYear :
1988
fDate :
32169
Firstpage :
42522
Lastpage :
42526
Abstract :
The question of future devices in GaAs must be influenced by the background of possible slowed growth, and must consider some of the technical issues affecting the cost of GaAs products, particularly integrated circuits. Following a brief review of some fundamental limits imposed by the GaAs material itself, the high electron mobility transistor (HEMT), heterojunction bipolar transistor (HBT), hot-electron transistor (HET) and the permeable base transistor (PBT) are discussed, and commented upon for their suitability as the basis of GaAs integrated circuits. Finally, the dependence of chip yield and manufacturability upon the resolution of physics- and technology-related issues is illustrated with reference to a chip case study
Keywords :
III-V semiconductors; bipolar transistors; gallium arsenide; high electron mobility transistors; integrated circuit technology; technological forecasting; GaAs integrated circuits; HBT; HEMT; PBT; chip yield; hot electron transistor; permeable base transistor;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Gallium Arsenide, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
208750
Link To Document :
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