• DocumentCode
    282971
  • Title

    Future devices for GaAs

  • Author

    Ladbrooke, P.H.

  • Author_Institution
    GEC Res. Ltd., Hirst Res. Centre, Wembley, UK
  • fYear
    1988
  • fDate
    32169
  • Firstpage
    42522
  • Lastpage
    42526
  • Abstract
    The question of future devices in GaAs must be influenced by the background of possible slowed growth, and must consider some of the technical issues affecting the cost of GaAs products, particularly integrated circuits. Following a brief review of some fundamental limits imposed by the GaAs material itself, the high electron mobility transistor (HEMT), heterojunction bipolar transistor (HBT), hot-electron transistor (HET) and the permeable base transistor (PBT) are discussed, and commented upon for their suitability as the basis of GaAs integrated circuits. Finally, the dependence of chip yield and manufacturability upon the resolution of physics- and technology-related issues is illustrated with reference to a chip case study
  • Keywords
    III-V semiconductors; bipolar transistors; gallium arsenide; high electron mobility transistors; integrated circuit technology; technological forecasting; GaAs integrated circuits; HBT; HEMT; PBT; chip yield; hot electron transistor; permeable base transistor;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Gallium Arsenide, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    208750