DocumentCode
282971
Title
Future devices for GaAs
Author
Ladbrooke, P.H.
Author_Institution
GEC Res. Ltd., Hirst Res. Centre, Wembley, UK
fYear
1988
fDate
32169
Firstpage
42522
Lastpage
42526
Abstract
The question of future devices in GaAs must be influenced by the background of possible slowed growth, and must consider some of the technical issues affecting the cost of GaAs products, particularly integrated circuits. Following a brief review of some fundamental limits imposed by the GaAs material itself, the high electron mobility transistor (HEMT), heterojunction bipolar transistor (HBT), hot-electron transistor (HET) and the permeable base transistor (PBT) are discussed, and commented upon for their suitability as the basis of GaAs integrated circuits. Finally, the dependence of chip yield and manufacturability upon the resolution of physics- and technology-related issues is illustrated with reference to a chip case study
Keywords
III-V semiconductors; bipolar transistors; gallium arsenide; high electron mobility transistors; integrated circuit technology; technological forecasting; GaAs integrated circuits; HBT; HEMT; PBT; chip yield; hot electron transistor; permeable base transistor;
fLanguage
English
Publisher
iet
Conference_Titel
Gallium Arsenide, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
208750
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